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Proceedings Paper

Hard x-ray imaging via crystal diffraction: first results of reflectivity measurements
Author(s): Filippo Frontera; Paola De Chiara; Mauro Gambaccini; Gianni Landini; G. Pasqualini
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Paper Abstract

Hard x-ray reflectivity measurements of mosaic crystals are being performed at the x-ray facility of the physics department of the University of Ferrara. This paper reports on preliminary results obtained by using flat samples of pyrolytic graphite (002) with a thickness of 2 mm and a mosaic spread of 0.3 deg. A short description is given of the experimental apparatus and calibration procedures followed.

Paper Details

Date Published: 1 October 1991
PDF: 7 pages
Proc. SPIE 1549, EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy II, (1 October 1991); doi: 10.1117/12.48332
Show Author Affiliations
Filippo Frontera, Ferrara Univ. and TESRE/CNR (Italy)
Paola De Chiara, Ferrara Univ. (Italy)
Mauro Gambaccini, Ferrara Univ. (Italy)
Gianni Landini, TESRE/CNR (Italy)
G. Pasqualini, Ferrara Univ. (Italy)

Published in SPIE Proceedings Vol. 1549:
EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy II
Oswald H. W. Siegmund; Richard E. Rothschild, Editor(s)

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