Share Email Print

Proceedings Paper

Refractive-index measurement using moire deflectometry: working conditions
Author(s): Diana Tentori; C. Lopez Famozo
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

An analysis of the parameters that limit the accuracy of moire deflectometry as a refractometry technique is made.

Paper Details

Date Published: 1 November 1991
PDF: 7 pages
Proc. SPIE 1535, Passive Materials for Optical Elements, (1 November 1991); doi: 10.1117/12.48317
Show Author Affiliations
Diana Tentori, CICESE (Mexico)
C. Lopez Famozo, CICESE (Mexico)

Published in SPIE Proceedings Vol. 1535:
Passive Materials for Optical Elements
Gary W. Wilkerson, Editor(s)

© SPIE. Terms of Use
Back to Top
Sign in to read the full article
Create a free SPIE account to get access to
premium articles and original research
Forgot your username?