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Proceedings Paper

Deposition of chemically sensitive polymer films by picosecond resonant infrared laser ablation
Author(s): Daniel M. Bubb; John H. Callahan; Richard F. Haglund Jr.; Eric J. Houser; James S. Horwitz; Robert Andrew McGill; Michael R. Papantonakis
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Paper Abstract

Pulsed laser deposition of complex, chemically sensitive polymers using tunable, picosecond infrared laser excitation has shown great promise for producing films of these materials appropriate for a wide variety of sensor and coating applications. Fourier-transform infrared spectra of the bulk starting polymers and those of the deposited thin films are nearly identical, verifying that the short-range order and chemical functionality of the polymers are preserved during the process. Gel permeation chromatography and mass spectrometry have been used to characterize the polydispersity of the mass distribution; here the results are mixed, with the mass distributions of some poly-mers being preserved while others show significant bond scission. Most recently, we have demonstrated that it is possible to coat cantilever structures with the polymer SFXA; the deposited polymer responds as desired when 'challenged' by appropriate chemicals.

Paper Details

Date Published: 13 September 2002
PDF: 12 pages
Proc. SPIE 4760, High-Power Laser Ablation IV, (13 September 2002); doi: 10.1117/12.482092
Show Author Affiliations
Daniel M. Bubb, Seton Hall Univ. (United States)
John H. Callahan, Naval Research Lab. (United States)
Richard F. Haglund Jr., Vanderbilt Univ. (United States)
Eric J. Houser, Naval Research Lab. (United States)
James S. Horwitz, Naval Research Lab. (United States)
Robert Andrew McGill, Naval Research Lab. (United States)
Michael R. Papantonakis, Vanderbilt Univ. (United States)

Published in SPIE Proceedings Vol. 4760:
High-Power Laser Ablation IV
Claude R. Phipps, Editor(s)

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