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Proceedings Paper

Physical optics computer code optimized for synchrotron radiation
Author(s): Oleg Chubar; Pascal Elleaume; Serguei Kuznetsov; Anatoly A. Snigirev
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Paper Abstract

Synchrotron Radiation Workshop (SRW) - a physical optics computer code optimized for the simulation of emission and propagation of coherent and partially-coherent synchrotron radiation is presented. The code consists of two parts, which can be used independently. One part is dedicated to the computation of electric field, intensity, spectral-angular characteristics of radiation emitted by relativistic electrons in undulators, wigglers, short magnets, etc. The other part of the code implements physical optics methods for wavefront propagation. The propagation in free space is made according to the Huygens-Fresnel principle, by means of a prime-factor 2D FFT. Normal-incident optical elements are described by a complex transmission function. Fast algorithm for the propagation of electro-magnetic field through simple waveguides is implemented. The propagation of partially-coherent radiation is done by summing up contributions to the final intensity from different sources (e.g. from distinct emitting electrons), taking into account the sources' properties and applying, when possible, the convolution theorem with respect to intensity. SRW code can be used for physical optics simulations, design and optimization of refractive and diffractive optical elements for various spectral ranges, from far infrared to hard X-rays.

Paper Details

Date Published: 4 September 2002
PDF: 7 pages
Proc. SPIE 4769, Optical Design and Analysis Software II, (4 September 2002); doi: 10.1117/12.481182
Show Author Affiliations
Oleg Chubar, European Synchrotron Radiation Facility (France)
Pascal Elleaume, European Synchrotron Radiation Facility (France)
Serguei Kuznetsov, European Synchrotron Radiation Facility (France)
Anatoly A. Snigirev, European Synchrotron Radiation Facility (France)

Published in SPIE Proceedings Vol. 4769:
Optical Design and Analysis Software II
Richard C. Juergens, Editor(s)

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