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Proceedings Paper

Adaptive interferometer measurement of the piezoelectric and electro-optic coefficients of PZT films
Author(s): Vasilii V. Spirin; Francisco J. Mendieta-Jimenez
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Paper Abstract

In this paper we present simple interferometric technique for thin film testing with GaAs:Cr adaptive photodetectors based on the effect of the non-steady-state photoelectromotive force. The technique needs no special vibroinsulation and automatically adjusts and keeps the operation point of the interferometer. Two different interferometric schemes with GaAs:Cr adaptive photodetectors are reported. A modified Mach-Zehnder interferometer with adaptive photodetector is used for the measurement of piezoelectric coefficient of the thin film. A two-beam polarization interferometer with adaptive photodetector is used for the measurement of effective differential Pockels coefficient re = r33-(n0/ne)3r13. It is shown that two-beam polarization technique allows measurement of the Pockels coefficient of thin film with a strong Fabry-Perot effect that usually presents in ferroelectric thin film. Strong hysteresis effect with a slightly asymmetric form of the hysteresis loop was observed at the dependence of d33 and re coefficients of the PZT thin film versus DC electric field. The values of d33 and re are in agreement with known data.

Paper Details

Date Published: 29 August 2002
PDF: 10 pages
Proc. SPIE 4905, Materials and Devices for Optical and Wireless Communications, (29 August 2002); doi: 10.1117/12.480990
Show Author Affiliations
Vasilii V. Spirin, CICESE (United States)
Francisco J. Mendieta-Jimenez, CICESE (United States)

Published in SPIE Proceedings Vol. 4905:
Materials and Devices for Optical and Wireless Communications
Constance J. Chang-Hasnain; YuXing Xia; Kenichi Iga, Editor(s)

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