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Proceedings Paper

Scatter analysis for particle contamination of a bisymmetric reflective system
Author(s): Andrew Cheng
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Paper Abstract

We demonstrate a step-by-step procedure of conducting a straylight scatter analysis due to particle contamination study using ASAP (Advanced System Analysis Program), a versatile, time-tested commercial software for modeling in optical and illumination systems, including wave effects, diffractive and scattering phenomenon. We hope to demonstrate that scalar optical modeling technology is mature and is highly suitable for commercial applications that are beginning to show higher demands in Signal-to-Noise ratios. Other systems that can be modeled include photonic fiber coupling systems, liquid crystal display technology, MEMS devices, as well as high intensity arc sources.

Paper Details

Date Published: 20 September 2002
PDF: 5 pages
Proc. SPIE 4927, Optical Design and Testing, (20 September 2002); doi: 10.1117/12.479541
Show Author Affiliations
Andrew Cheng, PROSYS Optics Corp. (United States)

Published in SPIE Proceedings Vol. 4927:
Optical Design and Testing
Zhicheng Weng; Jose M. Sasian; Yongtian Wang, Editor(s)

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