Share Email Print

Proceedings Paper

Subsurface 3D structures by laser-induced modification of the optical properties of transparent materials
Author(s): David Ashkenasi; Hans-Juergen Hoffmann; Dieter Krause; Gerhard J. Mueller
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

A new field in laser processing is opened by this method of modifying the optical properties, i.e. the refractive index, absorption- and scattering-coefficient, inside the material. Focusing ultra short laser pulses inside the transparent media allows to control and modify their optical properties. This is referred to as nik-engineering, relating the experimental technique to changes of the complex refractive index (n + ik). Three dimensional patterns of the (n + ik) modifications can be achieved in the subsurface region even on a microscopic scale. New results in nik-engineering obtained in our application laboratory are presented using different optical materials. The results in laser nik-engineering of photo-chromic glass using ultra short laser pulses at a wavelength of 800 nm are presented to the best of our knowledge for the first time. We discuss the results and the possibilities of nik-engineering and consider the technological relevance with respect to decorative work, micro-tagging, and other functional structures.

Paper Details

Date Published: 17 October 2003
PDF: 9 pages
Proc. SPIE 4977, Photon Processing in Microelectronics and Photonics II, (17 October 2003); doi: 10.1117/12.479233
Show Author Affiliations
David Ashkenasi, Laser- und Medizin-Technologie GmbH (Germany)
Hans-Juergen Hoffmann, Technische Univ. Berlin (Germany)
Dieter Krause, Schott Glas (Germany)
Gerhard J. Mueller, Laser- und Medizin-Technologie GmbH (Germany)

Published in SPIE Proceedings Vol. 4977:
Photon Processing in Microelectronics and Photonics II
Alberto Piqué; David B. Geohegan; Friedrich G. Bachmann; Koji Sugioka; Frank Träger; Jan J. Dubowski; Peter R. Herman; Willem Hoving; Kouichi Murakami; Kunihiko Washio; Jim Fieret, Editor(s)

© SPIE. Terms of Use
Back to Top
Sign in to read the full article
Create a free SPIE account to get access to
premium articles and original research
Forgot your username?