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Proceedings Paper

Linearized ray-trace analysis
Author(s): David C. Redding; William G. Breckenridge
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Paper Abstract

A new, coordinate-free version of the exact ray-trace equations for optical systems consisting of conic reflecting, refracting and reference surfaces is presented. These equations are differentiated to obtain closed-form optical sensitivity dyadics. For computation, the sensitivities are evaluated in a single global coordinate frame and combined in linearized ray-trace matrix difference equations that propagate the rays and the sensitivities from element to element. One purpose of this analysis is to create optical models that can be directly integrated with models of the instrument structure and control systems for dynamic simulation.

Paper Details

Date Published: 1 January 1991
PDF: 6 pages
Proc. SPIE 1354, 1990 Intl Lens Design Conf, (1 January 1991); doi: 10.1117/12.47910
Show Author Affiliations
David C. Redding, Charles Stark Draper Lab. (United States)
William G. Breckenridge, Jet Propulsion Lab. (United States)

Published in SPIE Proceedings Vol. 1354:
1990 Intl Lens Design Conf
George N. Lawrence, Editor(s)

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