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Proceedings Paper

Comparison of retro-reflectance and total integrated scatter as a function of angle of incidence based on reflectometer measurements
Author(s): David Gordon Crandall; William T. Bertrand; Bob E. Wood
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Paper Abstract

A laboratory prototype reflectometer with applications in scene content characterization is available at the Arnold Engineering Development Center (AEDC), Arnold AFB. The SCAT/R measures specular, total, and retro-reflectance at five angles of incidence (AOI) scanning from 2.5 to 15 micrometers . Diffuse reflectance, total integrated scatter (TIS), and thermal emittance are calculated from the measurements. Conventional TIS measurements provide a good measure of a surface finish deviation from specularity, but the scatter distribution is not obtainable from a single measurement. By making TIS measurements over a series of AOI, information on the distribution is obtained. For example, a diffuse surface can be evaluated to determine whether the scattering is characterized by a Lambertian distribution. It has been observed that a series of retro-reflectance measurements at various AOI yields similar angle resolved information. In this paper, the relationship between retro-reflectance and TIS as a function of AOI is investigated for various materials using data from SCAT/R scans. The presentation and analysis of the data follow a brief description of the instrument. The SCAT/R thermal infrared data is useful in identifying/cataloging polarization and hyperspectral characteristics of materials and coatings used for camouflage and for other target and background applications.

Paper Details

Date Published: 6 August 2002
PDF: 11 pages
Proc. SPIE 4718, Targets and Backgrounds VIII: Characterization and Representation, (6 August 2002); doi: 10.1117/12.478813
Show Author Affiliations
David Gordon Crandall, AZ Technology, Inc. (United States)
William T. Bertrand, Jacobs Sverdrup (United States)
Bob E. Wood, Bob Wood Aerospace Consulting Services Inc. (United States)

Published in SPIE Proceedings Vol. 4718:
Targets and Backgrounds VIII: Characterization and Representation
Wendell R. Watkins; Dieter Clement; William R. Reynolds, Editor(s)

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