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Proceedings Paper

Quasi-optical dynamical surface resistance characterization of HTS laser-ablated films
Author(s): M. Branescu; J. Jaklovsky; Carmen Ristoscu; Ion N. Mihailescu
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Paper Abstract

The paper presents a syntheses of the last data concerning the optimal parameters of the deposition process to obtain the best dynamic quality of HTS thin films in connection with the most precise dynamic measurement method known to date. The paper makes a comparison between the performances achieved by the classical dynamical surface resistance nondestructive measurement techniques of the HTS laser ablated thin films and the quasi- optical high performances one.

Paper Details

Date Published: 9 August 2002
PDF: 8 pages
Proc. SPIE 4762, ALT'01 International Conference on Advanced Laser Technologies, (9 August 2002); doi: 10.1117/12.478643
Show Author Affiliations
M. Branescu, National Institute for R&D of Material Physics (Romania)
J. Jaklovsky, National Institute for R&D of Material Physics (Romania)
Carmen Ristoscu, National Institute for Lasers, Plasma, and Radiation Physics (Romania)
Ion N. Mihailescu, National Institute for Lasers, Plasma, and Radiation Physics (Romania)


Published in SPIE Proceedings Vol. 4762:
ALT'01 International Conference on Advanced Laser Technologies
Dan C. Dumitras; Maria Dinescu; Vitali I. Konov, Editor(s)

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