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Proceedings Paper

Quantitative phase measurements using a quadrature tomographic microscope
Author(s): Daniel J. Townsend; Kregg D. Quarles; Anthony L. Thomas; Willie S. Rockward; Carol M. Warner; Judith A. Newmark; Charles A. DiMarzio
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Paper Abstract

The Quadrature Tomographic Microscope measures the amplitude and phase of an image. This information allows the user to see contrast features not available in other microscopes, and is critical to any three-dimensional reconstruction. We report on development and use of test objects to measure the accuracy and repeatability of phase measurements. A simple binary phase grating, a series of glass beads, and preimplantation mouse embryos were used in these experiments. The gratings were fabricated on high-quality fused-silica substrates whose transmission phase error was determined to be less than one-tenth wave error across their 25 mm diameter before fabrication. The phase step of the binary phase grating was measured using both the optical quadrature technique and the usual fringe-counting techniques applied to the raw data. Phase unwrapping techniques were validated by measuring the diameter of glass beads of a known size. Results are presented showing that the phase measurements agree with each other, with the known data, and with the spatial resolution in preimplantation mouse embryos. More complicated objects will be fabricated in the future to validate 3-D imaging techniques.

Paper Details

Date Published: 9 July 2003
PDF: 7 pages
Proc. SPIE 4964, Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing X, (9 July 2003); doi: 10.1117/12.478343
Show Author Affiliations
Daniel J. Townsend, Northeastern Univ. (United States)
Kregg D. Quarles, Morehouse College (United States)
Anthony L. Thomas, Morehouse College (United States)
Willie S. Rockward, Morehouse College (United States)
Carol M. Warner, Northeastern Univ. (United States)
Judith A. Newmark, Northeastern Univ. (United States)
Charles A. DiMarzio, Northeastern Univ. (United States)

Published in SPIE Proceedings Vol. 4964:
Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing X
Jose-Angel Conchello; Carol J. Cogswell; Tony Wilson, Editor(s)

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