Share Email Print

Proceedings Paper

Template-based software for accurate MEMS characterization
Author(s): Erik Novak; Michael B. Krell; Trisha Browne
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

One of the primary challenges in MEMS metrology is the large variety of shapes, lateral feature sizes, and vertical steps on MEMS devices. This paper describes a software approach by which ideal surface templates are generated for each MEMS device from the design files or prior measurements. These templates may contain multiple sub-regions, or data islands, each of which is generally characterized in a different manner. Surface measurements from a white-light interference microscope are matched with the ideal MEMS template using a variety of techniques and threshold criteria. The template-based technique is tolerant of errors both rotation and translation, allowing accurate characterization of each data island and their relative positions. This paper will explore the concepts used to generate templates, align actual data with the original template, and sources of error and robustness of each technique on several datasets. The effect of measurement and positional errors on both the overall match and on the sub-region analyses will be explored for characterization of datasets.

Paper Details

Date Published: 16 January 2003
PDF: 6 pages
Proc. SPIE 4980, Reliability, Testing, and Characterization of MEMS/MOEMS II, (16 January 2003); doi: 10.1117/12.478204
Show Author Affiliations
Erik Novak, Veeco Metrology Group (United States)
Michael B. Krell, Veeco Metrology Group (United States)
Trisha Browne, Veeco Metrology Group (United States)

Published in SPIE Proceedings Vol. 4980:
Reliability, Testing, and Characterization of MEMS/MOEMS II
Rajeshuni Ramesham; Danelle M. Tanner, Editor(s)

© SPIE. Terms of Use
Back to Top
Sign in to read the full article
Create a free SPIE account to get access to
premium articles and original research
Forgot your username?