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Proceedings Paper

III-V microsystems for infrared imaging and spectroscopic applications
Author(s): Jan P. Vermeiren
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Paper Abstract

During the last years, great progress has been made in all disciplines related to the realization of III-V based Infrared detectors. As a consequence, these detectors have become mature and they have the potential to cope with the competition of II-VI or IV-VI based IR detectors. Due to the wide variety of III-V material systems, one can cover a wavelengths range from the UV to the second thermal window. Due to the improved material quality, the requirements on read-out circuitry and on the packaging of IR sensor chips become more and more important; this necessitates the user to approach the design and verification of a sensor chip from a system perspective instead of concentrating on the device physics.

Paper Details

Date Published: 11 March 2003
PDF: 10 pages
Proc. SPIE 4947, Laser Diodes, Optoelectronic Devices, and Heterogenous Integration, (11 March 2003); doi: 10.1117/12.476896
Show Author Affiliations
Jan P. Vermeiren, XenICs nv (Belgium)

Published in SPIE Proceedings Vol. 4947:
Laser Diodes, Optoelectronic Devices, and Heterogenous Integration
John Gerard McInerney; Alfred Driessen; Roel G. Baets; Ephraim Suhir, Editor(s)

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