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Proceedings Paper

Random walk analysis of time-resolved transmittance measurements
Author(s): Ines Delfino; Maria Lepore; Pietro Luigi Indovina
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Paper Abstract

Many biomedical applications of time-resolved transmittance require precise measurements of optical properties of scattering samples. Recently, random walk theory has been proposed to accurately model the time-resolved transmittance and reflectance across uniform slabs of scattering media as well as slabs containing isolated targets of different scattering or absorbing properties. In this paper random walk description of light propagation in turbid media has been used to analyse transmittance measurements for optical characterization of scattering and absorbing media. A femtosecond Ti:Sa laser working at 800 nm and a streak camera with a time resolution of a few picoseconds have been employed. Various Intralipid suspensions with and without absorbing ink have been investigated. These studies have experimentally confirmed that random walk theory can be usefully employed to discriminate small changes in absorbing and scattering properties. An appropriate fitting procedure, without arbitrary constrains, have been checked and used. In addition, the detailed investigation here reported can help in defining the applicability range of random walk description. This analysis can be important since random walk is a powerful and versatile theory as fast and efficient solution of the inverse problem in optical tomography also for sophisticated geometry and for a wide range of optical properties.

Paper Details

Date Published: 29 July 2003
PDF: 10 pages
Proc. SPIE 4955, Optical Tomography and Spectroscopy of Tissue V, (29 July 2003); doi: 10.1117/12.476800
Show Author Affiliations
Ines Delfino, INFM, Univ. della Tuscia (Italy)
Maria Lepore, INFM, Seconda Univ. degli Studi di Napoli (Italy)
Pietro Luigi Indovina, INFM, Univ. degli Studi di Napoli Federico II (Italy)

Published in SPIE Proceedings Vol. 4955:
Optical Tomography and Spectroscopy of Tissue V
Britton Chance; Robert R. Alfano; Bruce J. Tromberg; Mamoru Tamura; Eva M. Sevick-Muraca, Editor(s)

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