Share Email Print

Proceedings Paper

Dynamic magnetomechanical behavior of Terfenol-D/epoxy 1-3 composite
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

This paper presents an experimental investigation of the dynamic behavior of a 1-3 type magnetostrictive composite, with emphasis on the evaluation of fundamental material properties pertinent to device design. The fabricated 1-3 magnetostrictive composite comprises 51 percent volume fraction of Terfenol-D particulates embedded and magnetically aligned in a passive epoxy matrix. The dynamic magnetomechanical properties of the composite are measured as functions of bias field, drive field, and frequency. These properties include Young's moduli at constant magnetic field strength (EH3) and at constant magnetic flux density (EB3), magnetomechanical coupling coefficient (k33), dynamic relative permeability (ur33), dynamic strain coefficient (d33), mechanical quality factor (Qm), and the ratio of the dynamic strain coefficient to the dynamic susceptibility. Dependence of material properties on applied fields and frequency is observed with no evidence of eddy current losses. The observed eddy current effect agrees with the prediction of classical eddy current theory. This suggests that the composite can provide superior high-frequency performance as compared to monolithic Terfenol-D and laminated Terfenol-D systems. Implications for high-frequency applications of the material to resonance devices are also described.

Paper Details

Date Published: 11 July 2002
PDF: 12 pages
Proc. SPIE 4699, Smart Structures and Materials 2002: Active Materials: Behavior and Mechanics, (11 July 2002); doi: 10.1117/12.475001
Show Author Affiliations
Siu Wing Or, Univ. of California/Los Angeles (United States)
Nersesse Nersessian, Univ. of California/Los Angeles (United States)
Gregory Paul Carman, Univ. of California/Los Angeles (United States)

Published in SPIE Proceedings Vol. 4699:
Smart Structures and Materials 2002: Active Materials: Behavior and Mechanics
Christopher S. Lynch, Editor(s)

© SPIE. Terms of Use
Back to Top