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Proceedings Paper

Hardware-in-the-loop sensor testing using measured and modeled signature data with the real-time IR/EO scene simulator (RISS)
Author(s): Michael J. Eldridge; Stephen E. Jacobs
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Paper Abstract

Amherst Systems has previously developed a Real-time IR/EO Scene Simulator (RISS) for use in reactive, hardware-in-the-loop testing of infrared sensor systems. This paper will report on how RISS is currently being used to test and develop a variety of sensor systems, with emphasis on the use of both measured and modeled signature data to create test scenarios. Ongoing efforts to utilize models and data such as DIRSIG, RadTherm, MuSES, TERTEM, and PRA WITMaps will be examined, and their relevance to specific testing requirements will be explored. For example, Amherst Systems has recently completed an effort for a U.S. Government organization to construct a suite of operational scenarios to be used in conjunction with its previously installed RISS in order to stimulate a specific IR/EO sensor in a test environment. These scenarios used both measured and modeled data. This paper will explain how data from several sources were assembled into cohesive scenarios to model real, operational environments and engagements. It will detail the sources for all measured data that were used throughout the scenario development process. It will also explain how readily available, government-furnished models (such as MODTRAN, DISAMS, SPF/SPURC, and BLUEMAX) were used to construct these integrated scenarios, making validation of the scenarios much more feasible.

Paper Details

Date Published: 12 July 2002
PDF: 11 pages
Proc. SPIE 4717, Technologies for Synthetic Environments: Hardware-in-the-Loop Testing VII, (12 July 2002); doi: 10.1117/12.474720
Show Author Affiliations
Michael J. Eldridge, Northrop Grumman Corp. (United States)
Stephen E. Jacobs, Northrop Grumman Corp. (United States)

Published in SPIE Proceedings Vol. 4717:
Technologies for Synthetic Environments: Hardware-in-the-Loop Testing VII
Robert Lee Murrer Jr., Editor(s)

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