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Proceedings Paper

Long-term reliability of high-power single-mode 980-nm pump laser diodes
Author(s): Kejian Luo; Aland K. Chin; Zuntu Xu; Alan Nelson; Wei Gao
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Paper Abstract

The long-term reliability of high-power, single-mode, 980 nm, InGaAs/GaAlAs/GaAs, laser diodes is reported. We have performed constant-current aging at at 85°C for three operating currents, 450 mA (~300 mW), 550 mA (~350 mW) and 700 mA (~420 mW). The data for 450 mA aging indicate a total failure rate of less than 250 FITs at a confidence level of 60%. For 550 mA and 700 mA operating currents, no degradation in laser performance within the 5% measurement accuracy of our test equipment have been observed during the first thousand hours of testing.

Paper Details

Date Published: 19 June 2003
PDF: 7 pages
Proc. SPIE 4993, High-Power Fiber and Semiconductor Lasers, (19 June 2003); doi: 10.1117/12.473282
Show Author Affiliations
Kejian Luo, Axcel Photonics, Inc. (United States)
Aland K. Chin, Axcel Photonics, Inc. (United States)
Zuntu Xu, Axcel Photonics, Inc. (United States)
Alan Nelson, Axcel Photonics, Inc. (United States)
Wei Gao, Axcel Photonics, Inc. (United States)

Published in SPIE Proceedings Vol. 4993:
High-Power Fiber and Semiconductor Lasers
Mahmoud Fallahi; Jerome V. Moloney, Editor(s)

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