Share Email Print

Proceedings Paper

Development of a high-speed texture measurement system
Author(s): Yong Rao; Xuhan Jiang; Xuemin Chen; C. Richard Liu
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

A high-speed measurement system has been successfully developed to measure the pavement surface texture. This device is based on the laser triangulation measurement using a position sensitive device (PSD) as detector. In this paper we will discuss the basic design and implementation of the system. This system has a sampling rate of 175kHz, which greatly increases the ability of texture profiling and provides more quantitative information for the pavement measurement. The proper accuracy of dynamic measurement (0.02mm) guarantees correct detection in the particular applications on the pavement surface quality inspection. The flexible-hardware design enhances the system's performance under various practical situations, especially the high-response frequency, which makes the system control more prompt in handling the suddenly changed slopes and colors. The resolution in both static and dynamic measurement, the temperature shifting, the noise level, and the good repeatability indicates that the system has a good functionality at a very low cost. The experiment results illustrate that the system not only facilitates the high-speed macro/micro texture profiling, but also provides great potential to the wide industrial applications that need fast measurement.

Paper Details

Date Published: 28 June 2002
PDF: 9 pages
Proc. SPIE 4696, Smart Structures and Materials 2002: Smart Systems for Bridges, Structures, and Highways, (28 June 2002); doi: 10.1117/12.472564
Show Author Affiliations
Yong Rao, Univ. of Houston (United States)
Xuhan Jiang, Univ. of Houston (United States)
Xuemin Chen, Univ. of Houston (United States)
C. Richard Liu, Univ. of Houston (United States)

Published in SPIE Proceedings Vol. 4696:
Smart Structures and Materials 2002: Smart Systems for Bridges, Structures, and Highways
S.-C. Liu; Darryll J. Pines, Editor(s)

© SPIE. Terms of Use
Back to Top
Sign in to read the full article
Create a free SPIE account to get access to
premium articles and original research
Forgot your username?