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Proceedings Paper

Design of a test set for characterization of optical devices in silica-based optical integrated circuit technology
Author(s): Khadijeh Bayat; Mahdi Farrokh Baroughi; Nosratollah Granpayeh
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Paper Abstract

One of the main problems in modeling guided wave devices in silica is the determination of the proper input parameters to the model. In this paper, we propose a method to determine five critical parameters: the depth, the length, the refractive index, the loss, and the thermo-optic coefficient of the silica waveguide. The finite difference method is used for the calculation of the optical modes in waveguides with a step index profile. The Beam Propagation Method (BPM) is used to analyze the test structures of the test-chip. The test set includes a planar waveguide, a symmetric Mach-Zehnder structure, an asymmetric Mach-Zehnder structure, and a series of planar waveguides with different lengths. This test-set is designed based on 1um Optical Integrated Circuit (OIC) technology.

Paper Details

Date Published: 3 April 2003
PDF: 12 pages
Proc. SPIE 4944, Integrated Optical Devices: Fabrication and Testing, (3 April 2003); doi: 10.1117/12.472448
Show Author Affiliations
Khadijeh Bayat, Iran Telecommunication Research Center (Iran)
Mahdi Farrokh Baroughi, Univ. of Waterloo (Canada)
Nosratollah Granpayeh, K.N. Toosi Univ. of Technology (Iran)

Published in SPIE Proceedings Vol. 4944:
Integrated Optical Devices: Fabrication and Testing
Giancarlo C. Righini, Editor(s)

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