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Proceedings Paper

Interferometric method to characterize thermal elongation of near-field optics probes
Author(s): Andres H. La Rosa; Bjorn Biehler; Arijit Sinharay; Hans D. Hallen
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Paper Abstract

This paper presents a new method that exploits the interference and polarization properties of light to monitor, in real time, the rapid thermal elongation of near-field optical probes. The typically flat (nanometer in size) morphology of the probe apex serves as one mirror of a Fabry-Perot type cavity; a flat semitransparent metal coated surface constitutes the other mirror. The optical-interferometry set-up permits distance acquisition with a high frequency bandwidth (compared to other methods based on electronic feedback) while control of the light polarization allows an increase of the signal to noise ratio of the measurements.

Paper Details

Date Published: 20 June 2002
PDF: 4 pages
Proc. SPIE 4777, Interferometry XI: Techniques and Analysis, (20 June 2002); doi: 10.1117/12.472244
Show Author Affiliations
Andres H. La Rosa, Portland State Univ. (United States)
Bjorn Biehler, Portland State Univ. (Germany)
Arijit Sinharay, Portland State Univ. (United States)
Hans D. Hallen, North Carolina State Univ. (United States)

Published in SPIE Proceedings Vol. 4777:
Interferometry XI: Techniques and Analysis
Katherine Creath; Joanna Schmit, Editor(s)

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