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Proceedings Paper

Photosensitivity of selenium-bismuth films with varigap structure
Author(s): Anatolyi I. Popov; N. Mikhalev; A. Karalyunts; O. Smirnov; N. Vasilyeva
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Paper Abstract

The results of creating and investigating the electrophotographic layers on the basis of selenium-bismuth system with variable bismuth concentration along the thickness of the film are given. The samples for the investigations were obtained by means of thermal coevaporation of components on the oxidized aluminum substrate. Investigation of molecular and electron structure and those of electrophotographic properties of varigap films on the basis of Se-Bi showed the possibility of effective control of both spectral dependence and of absolute values of electrophotographic sensitivity of the films.

Paper Details

Date Published: 1 November 1991
PDF: 6 pages
Proc. SPIE 1519, International Conference on Thin Film Physics and Applications, (1 November 1991); doi: 10.1117/12.47180
Show Author Affiliations
Anatolyi I. Popov, Moscow Power Engineering Institute (Russia)
N. Mikhalev, Moscow Power Engineering Institute (Russia)
A. Karalyunts, Moscow Power Engineering Institute (Russia)
O. Smirnov, Moscow Power Engineering Institute (Russia)
N. Vasilyeva, Moscow Power Engineering Institute (Russia)

Published in SPIE Proceedings Vol. 1519:
International Conference on Thin Film Physics and Applications
Shixun Zhou; Yongling Wang, Editor(s)

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