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Proceedings Paper

Measurement of gain spectra, refractive index shift, and linewidth enhancement factor in Al-free 980-nm lasers with broadened waveguide
Author(s): Daniel Rodriguez; Luis Borruel; Ignacio Esquivias; Michel M. Krakowski; Philippe Collot
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Paper Abstract

Measurements of the optical gain, differential refractive index and linewidth enhancement factor ((alpha) parameter) in 980 nm InGaAs/InGaAsP broad area lasers diodes are presented. Two different experimental configurations for the measurement of the Amplified Spontaneous Emission spectra, both using a spatial filtering technique, are compared. A new procedure for extracting the modal index change in the case of low optical confinement factor laser structures is proposed. We present and discuss the influence of the experimental technique, and of the data processing on the extracted value of the gain and ß parameter as a function of injection level.

Paper Details

Date Published: 12 June 2002
PDF: 11 pages
Proc. SPIE 4646, Physics and Simulation of Optoelectronic Devices X, (12 June 2002); doi: 10.1117/12.470534
Show Author Affiliations
Daniel Rodriguez, Univ. Politecnica de Madrid (Spain)
Luis Borruel, Univ. Politecnica de Madrid (Spain)
Ignacio Esquivias, Univ. Politecnica de Madrid (Spain)
Michel M. Krakowski, Thales Research and Technology (France)
Philippe Collot, Thales Research and Technology (France)

Published in SPIE Proceedings Vol. 4646:
Physics and Simulation of Optoelectronic Devices X
Peter Blood; Marek Osinski; Yasuhiko Arakawa, Editor(s)

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