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Proceedings Paper

Nanoscale spatially resolved simultaneous measurement of in-plane and out-of-plane force components on surfaces: a novel operational mode in atomic force microscopy
Author(s): Gregory S. Watson; Bradley P. Dinte; Jolanta A. Blach; Sverre Myhra
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Paper Abstract

The atomic force microscope (AFM) allows investigation of the properties of surfaces and interfaces at atomic scale resolution. However, several different operational modes, (imaging, force versus distance and lateral force modes), need to be deployed in order to gain insight into the structure, tribological and mechanical properties. A new method, based on a variation of the force versus distance mode, has been developed. In essence, a coupling of the deformational modes of the probe is exploited whereby the tip is induced to undergo lateral travel in response to application of an out-of-plane force (and thus normal bending of the force-sensing lever). The lateral travel induces in-plane forces that are then measurable as a consequence of stimulation of the 'buckling' deformational mode of the lever. Due to the lever geometry, the technique offers an increase in resolution of an order of magnitude over existing AFM methods for measurement of atomic scale stick-slip events. In addition, the method allows measurement of the lateral deformation of the sample as well as scanner calibration. Outcomes will be demonstrated for atomically flat surfaces such as WTe2 and highly oriented pyrolytic graphite.

Paper Details

Date Published: 13 November 2002
PDF: 12 pages
Proc. SPIE 4934, Smart Materials II, (13 November 2002); doi: 10.1117/12.469732
Show Author Affiliations
Gregory S. Watson, Griffith Univ. (Australia)
Bradley P. Dinte, Griffith Univ. (Australia)
Jolanta A. Blach, Griffith Univ. (Australia)
Sverre Myhra, Griffith Univ. (Australia)

Published in SPIE Proceedings Vol. 4934:
Smart Materials II
Alan R. Wilson, Editor(s)

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