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Proceedings Paper

Characterization of epoxy coating degradation using NDE imaging techniques
Author(s): Jochen Hoffmann; Victoria Kramb; Joel Johnson; Norbert Meyendorf
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Paper Abstract

Polymeric aerospace coating systems are subject to environmental degradation from ultraviolet light, water exposure and thermal cycling. This paper discusses the current progress in a novel study to develop nondestructive evaluation (NDE) methods for monitoring coating degradation during service. In the current study, weathering tests were conducted for varying lengths of time. The examined specimens were single layer epoxies on aluminum alloy (AA2024-T3) substrates. Artificial weathering of the coated samples was conducted using simulated sunlight exposure (Xenon arc lamps), combined with heat and humidity. The coatings were characterized using spectroscopic and NDE techniques after each exposure interval. The NDE included infrared microscopy and scanning acoustic microscopy (SAM). IR absorption spectra as a function of UV radiation exposure were obtained by using attenuated total reflection- infrared spectroscopy (ATR-FTIR). These spectra provide quantitative measures of coating degradation and enabled a correlation with SAM measurements. Thus, potential acoustic parameters could be identified that can be used to track coating degradation. Degradation in the coating as indicated by the IR spectra and NDE data will be correlated with physical changes observed in the coating morphology.

Paper Details

Date Published: 7 June 2002
PDF: 8 pages
Proc. SPIE 4703, Nondestructive Evaluation and Reliability of Micro- and Nanomaterial Systems, (7 June 2002); doi: 10.1117/12.469616
Show Author Affiliations
Jochen Hoffmann, Univ. of Dayton (United States)
Victoria Kramb, Univ. of Dayton (United States)
Joel Johnson, Air Force Research Lab. (United States)
Norbert Meyendorf, Univ. of Dayton (United States)

Published in SPIE Proceedings Vol. 4703:
Nondestructive Evaluation and Reliability of Micro- and Nanomaterial Systems
Norbert Meyendorf; George Y. Baaklini; Bernd Michel, Editor(s)

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