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Proceedings Paper

Damage detection and characterization in smart CFRP composites
Author(s): Gerhard Mook; Juergen Pohl; Fritz Michel; Sven Herold
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Paper Abstract

Smart materials based on carbon fiber-reinforced plastics with embedded PZT sensors and actuators are expected to be a favorite composite for vibration damping and noise reduction. Due to the wide variety of physical properties of the components various damage mechanisms may reduce or even remove the sensing and actuating capabilities of the piezoceramic material. Comprehensive non-destructive characterization and integral health monitoring help to optimize the structure and its manufacturing and are essential prerequisites to ensure performance and availability of smart components during their life time. The first part of the paper presents high resolution non- destructive imaging methods including microfocus X-rays, ultrasonics and eddy currents. These methods are used to characterize damages resulting from non-optimal manufacturing and external load. The second part is dedicated to newly developed imaging techniques using the active piezoceramics as transmitters of acoustic, electromagnetic and thermal fields. The third part focuses on health monitoring by impedance spectroscopy using the same piezoceramics as for vibration damping. Electromechanical finite-element-modeling and experimental investigations at strip-shaped specimens have shown the close connection between mechanical properties and electrical impedance.

Paper Details

Date Published: 7 June 2002
PDF: 9 pages
Proc. SPIE 4703, Nondestructive Evaluation and Reliability of Micro- and Nanomaterial Systems, (7 June 2002); doi: 10.1117/12.469615
Show Author Affiliations
Gerhard Mook, Otto-von-Guericke-Univ. Magdeburg (Germany)
Juergen Pohl, Otto-von-Guericke-Univ. Magdeburg (Germany)
Fritz Michel, Otto-von-Guericke-Univ. Magdeburg (Germany)
Sven Herold, Otto-von-Guericke-Univ. Magdeburg (Germany)

Published in SPIE Proceedings Vol. 4703:
Nondestructive Evaluation and Reliability of Micro- and Nanomaterial Systems
Norbert Meyendorf; George Y. Baaklini; Bernd Michel, Editor(s)

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