In this lecture, the process of wavelet transform (WT) is reported for the image patterns of photomechanics, that involve carrier fringe patterns and randomly distributed speckle patterns. For the frequency modulated carrier patterns, the results from wavelet transform are compared with that from Fourier transform (FT), which shows the advantages of WT in the solution of high graduate problems such as concentration of strains and localization of solid-liquid interface. For the correlation matching of the speckle images during deformation, the computation based on wavelet coefficient shows sharper correlation peak than the convenient algorithms directly based on gray levels. 2D WT is presented to process the displacement fields resulted from correlation to show the detection of the crack singularity in materials by the wavelet transformation.

Date Published: 29 May 2002
PDF: 6 pages
Proc. SPIE 4537, Third International Conference on Experimental Mechanics, (29 May 2002); doi: 10.1117/12.468756

Published in SPIE Proceedings Vol. 4537:
Third International Conference on Experimental Mechanics
Xiaoping Wu; Yuwen Qin; Jing Fang; Jingtang Ke, Editor(s)