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Proceedings Paper • Open Access

Michelson-interferometer-based method for measuring the angle of rotation
Author(s): Cexiang Foo; Gaurav Madan; Theresa Lai; Mark Wee; Yu Fu; Huai Min Shang

Paper Abstract

For measuring the angle of rotation of flat objects using projected fringes, the method of point-of-light triangulation and the method of line-of-light triangulation will breakdown when the grating lies on the axis of rotation. Therefore, a grating other than a point or linear lines is preferred. In this paper, a simple Michelson interferometer-based method for the generation and projection of circular gratings is described. The basic optical element in a Michelson interferometer is a beam- splitting cube. With this Michelson interferometer, a circular grating is observed when the screen is placed normal to the line containing the two point-light sources produced by the beam splitter. By placing an expander between the beam-splitter and the laser source, and by carefully adjusting the two mirrors beside the beam- splitting cube, the frequency of the circular grating can be adjusted. This paper also describes the use of the generated circular optical grating for measuring the amount of rotation of flat surfaced that are either diffuse or specularly reflective - the method is based on relating the distortion of the circular grating to the angular rotation of the surface.

Paper Details

Date Published: 28 May 2002
PDF: 6 pages
Proc. SPIE 4588, Seventh International Conference on Education and Training in Optics and Photonics, (28 May 2002); doi: 10.1117/12.468719
Show Author Affiliations
Cexiang Foo, Raffles Institution (Singapore)
Gaurav Madan, Raffles Institution (Singapore)
Theresa Lai, Raffles Institution (Singapore)
Mark Wee, Raffles Institution (Singapore)
Yu Fu, National Univ. of Singapore (Singapore)
Huai Min Shang, National Univ. of Singapore (Singapore)

Published in SPIE Proceedings Vol. 4588:
Seventh International Conference on Education and Training in Optics and Photonics
Tuan-Kay Lim; Robert P. Breault; Arthur H. Guenther; Arthur H. Guenther, Editor(s)

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