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Proceedings Paper

Two-dimensional birefringence measurement using liquid crystal retarder for plastic disk inspection
Author(s): Yukitoshi Otani; Lianhua Jin; Yuki Sakaino
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Paper Abstract

A plastic disk for the next generation of an optical disk and/or a hard disk requires high quality surface. Especially its flatness is very important. Moreover surface conditions of disks are very important for covered thin film. A plastic disk inspection system is proposed by using a two-dimensional birefringence distribution using liquid crystal rederders. If there is an internal strain or a residual stress in disk, small birefringence can be observed. It is necessary for the birefringence measurement to determine the relative retardation and the azimuthal angle of the fast axis in plastic disks. In this paper, a measurement system of two-dimensional birefringence distribution is proposed. Several images captured by a CCD camera are sufficient for one birefringence distribution analysis. These experimental procedures and the results of plastic disks are discussed.

Paper Details

Date Published: 20 September 2002
PDF: 5 pages
Proc. SPIE 4919, Advanced Materials and Devices for Sensing and Imaging, (20 September 2002); doi: 10.1117/12.465750
Show Author Affiliations
Yukitoshi Otani, Tokyo Univ. of Agriculture and Technology (Japan)
Lianhua Jin, Tokyo Univ. of Agriculture and Technology (Japan)
Yuki Sakaino, Tokyo Univ. of Agriculture and Technology (Japan)

Published in SPIE Proceedings Vol. 4919:
Advanced Materials and Devices for Sensing and Imaging
Jianquan Yao; Yukihiro Ishii, Editor(s)

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