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Proceedings Paper

Parametric investigation of multispectral imaging
Author(s): David Connah; Stephen Westland; Mitchell G. A. Thomson
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Paper Abstract

Multi-spectral imaging systems can be used recover estimates of the spectral reflectance properties of surfaces in an image. This process can be aided by utilizing a priori knowledge of the reflectance spectra derived from linear models of surface reflectance. We use this recovery method in a simulated camera system, and investigate the effect of varying sensor characteristics and illuminants on the accuracy of the system. We also investigate the effect of quantization noise and random sensor noise on the process. Unlike other recovery methods, increasing the number of sensors in the system - and hence the number of basis functions used in the linear model - does not necessarily improve performance. We find that increasing the amount of noise increases reconstruction error and it does so to a greater extent for large sensor numbers and large sensor bandwidths. The robustness of the process to noise is improved by using illuminants that have approximately equal power across all visible wavelengths of light.

Paper Details

Date Published: 6 June 2002
PDF: 4 pages
Proc. SPIE 4421, 9th Congress of the International Colour Association, (6 June 2002); doi: 10.1117/12.464655
Show Author Affiliations
David Connah, Univ. of Derby (United Kingdom)
Stephen Westland, Univ. of Derby (United Kingdom)
Mitchell G. A. Thomson, Univ. of Derby (United Kingdom)

Published in SPIE Proceedings Vol. 4421:
9th Congress of the International Colour Association
Robert Chung; Allan Rodrigues, Editor(s)

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