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Proceedings Paper

Advances in color measurement
Author(s): David L. Battle; Harry J. Oana; Coleman F. Shannon
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Paper Abstract

A high-performance, dual-beam spectral analyzer, the SP- 2000, has been developed based on active-pixel complementary-metal-oxide-semiconductor (CMOS) technology. Each of the two diode arrays contain 256 pixels. The small size of the analyzer allows it to be used in portable spectrophotometers. A wavelength range from 360 to 780 nm has been achieved with a wavelength resolution of 1.8 nm and a signal-to-noise ratio of 85 dB. Wavelength calibration is done separately from the instrument using eight narrow-band spectral lines. Fiber optics are used to connect the spectral analyzer with an integrating sphere so that areas as small as 3 mm can be accurately measured.

Paper Details

Date Published: 6 June 2002
PDF: 4 pages
Proc. SPIE 4421, 9th Congress of the International Colour Association, (6 June 2002); doi: 10.1117/12.464610
Show Author Affiliations
David L. Battle, Datacolor International (United States)
Harry J. Oana, Datacolor International (United States)
Coleman F. Shannon, Datacolor International (United States)

Published in SPIE Proceedings Vol. 4421:
9th Congress of the International Colour Association
Robert Chung; Allan Rodrigues, Editor(s)

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