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Proceedings Paper

Method to measure reflection-induced retardance without compensator
Author(s): Zheng Ping Wang; Qingbo Li; Huili Wang; Ruiying Feng; Zongjun Huang; Xin Yu; Jinhui Shi
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Paper Abstract

The measurement of reflection-induced retardance of optical devices is the usual case encountered in optical research, development and engineering. This kind of measurement usually can be completed using a linear polarizer and a retarder. A novel method used for the measurement of reflection-induced retardance employing a polarizer and an analyzer is proposed in this paper, the theoretical analysis of the method and an application example are given.

Paper Details

Date Published: 20 September 2002
PDF: 9 pages
Proc. SPIE 4927, Optical Design and Testing, (20 September 2002); doi: 10.1117/12.464300
Show Author Affiliations
Zheng Ping Wang, Harbin Engineering Univ. (China)
Qingbo Li, Harbin Engineering Univ. (China)
Huili Wang, Harbin Engineering Univ. (China)
Ruiying Feng, Harbin Engineering Univ. (China)
Zongjun Huang, Harbin Engineering Univ. (China)
Xin Yu, Harbin Engineering Univ. (China)
Jinhui Shi, Harbin Engineering Univ. (China)

Published in SPIE Proceedings Vol. 4927:
Optical Design and Testing
Zhicheng Weng; Jose M. Sasian; Yongtian Wang, Editor(s)

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