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Proceedings Paper

Measurement system for photodetector characterization
Author(s): Anssi Jaakko Maekynen; Sampo Backman; Juha Tapio Kostamovaara
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Paper Abstract

A measurement system for electro-optical characterization of photodetectors and photodetector arrays is presented. The system is intended for laboratory use where typically a few devices are characterized at a time. The instrument is designed for determining the photoresponse (dc and pulse) of a single photodetector or a photodetector array as a function of wavelength, position, and temperature. In case of photodetector arrays, the measurement of modulation transfer function (MTF) and fast determination of its photoresponse nonuniformity (PRNU) is also possible. The instrument setup and experimental results are presented.

Paper Details

Date Published: 27 August 2003
PDF: 7 pages
Proc. SPIE 4876, Opto-Ireland 2002: Optics and Photonics Technologies and Applications, (27 August 2003); doi: 10.1117/12.464022
Show Author Affiliations
Anssi Jaakko Maekynen, Univ. of Oulu (Finland)
Sampo Backman, Univ. of Oulu (Finland)
Juha Tapio Kostamovaara, Univ. of Oulu (Finland)

Published in SPIE Proceedings Vol. 4876:
Opto-Ireland 2002: Optics and Photonics Technologies and Applications
Vincent Toal; Norman Douglas McMillan; Gerard M. O'Connor; Eon O'Mongain; Austin F. Duke; John F. Donegan; James A. McLaughlin; Brian D. MacCraith; Werner J. Blau, Editor(s)

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