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Proceedings Paper

Fast lens testing using random targets
Author(s): Sampo Backman; Anssi Jaakko Maekynen; Timo T. Kolehmainen; Kai M. Ojala
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Paper Abstract

The performance of a random target method for fast MTF measurement of a lens is evaluated. Although the method is well-known, its potential for fast lens testing has not been assessed in the open literature. To optimize speed, the simplest possible instrument setup with minimum amount of mechanical movements during measurement execution is used. The setup includes only a random target, lens under test and a CCD camera with focus adjustment. The target consists of a random black and white pattern of a flat spectrum. The MTF of the lens is acquired by imaging the random target on the CCD using the lens, and then analyzing the spatial frequency content of the image using an ordinary PC. It was found out that a suitable compromise between speed and precision is achieved using a matrix of 128*128 samples per measured field point. This provides better than 2% precision and a few second's total execution time per lens including best focus evaluation and the measurement of tangential and sagittal MTF curves of 5 field points. Using commercially available components, measurement frequencies up to 100 cycles/mm seem achievable using the simple instrument setup.

Paper Details

Date Published: 27 August 2003
PDF: 10 pages
Proc. SPIE 4876, Opto-Ireland 2002: Optics and Photonics Technologies and Applications, (27 August 2003); doi: 10.1117/12.463918
Show Author Affiliations
Sampo Backman, Univ. of Oulu (Finland)
Anssi Jaakko Maekynen, Univ. of Oulu (Finland)
Timo T. Kolehmainen, Nokia Mobile Phones (Finland)
Kai M. Ojala, Nokia Mobile Phones (Finland)

Published in SPIE Proceedings Vol. 4876:
Opto-Ireland 2002: Optics and Photonics Technologies and Applications
Vincent Toal; Norman Douglas McMillan; Gerard M. O'Connor; Eon O'Mongain; Austin F. Duke; John F. Donegan; James A. McLaughlin; Brian D. MacCraith; Werner J. Blau, Editor(s)

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