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Proceedings Paper

Nonlinear optical changes in 1D photonic bandgaps of cholesteric liquid crystal
Author(s): Jeong Weon Wu; Jisoo Hwang; N. Y. Ha; J. Lim; Byoungchoo Park; Chang-Jun Ahn; Suk-Young Khoo; Chi-Sup Jung
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Paper Abstract

A cholesteric liquid crystal cell was fabricated possessing 1-D photonic bandgap structure. From the measurement of the linear absorption spectrum of the cell, a bandgap was identified, centered at 1.08 eV (1143 nm) with the gap width of 0.1 eV (100 nm). Based on the linear absorption spectra, the dispersion of the principal refractive indices along the parallel and perpendicular directions of the molecule was determined as 1.631 and 1.476 at the wavelength of 1064 nm through Berreman matrix method. A Q-switched Nd:YAG laser (1064 nm) was employed to investigate the nonlinear optical changes of photonic bandgap. As the laser intensity was increased to 320 MW/cm2, the transmittance decreased from 0.51 to 0.47, corresponding to an 8% change. The nonlinear transmittance change was analyzed numerically by Berreman matrix method with the incorporation of Kerr nonlinearity in the optical response of the molecules forming cholesteric liquid crystal. The changes in the refractive indices along the parallel and perpendicular directions were 3.46 and 1.51 X 10-10 (cm2/W). The changes in the position and width of bandgap were 0.02 eV and 0.03 eV at the laser intensity of 320 MW/cm2.

Paper Details

Date Published: 25 April 2002
PDF: 6 pages
Proc. SPIE 4655, Photonic Bandgap Materials and Devices, (25 April 2002); doi: 10.1117/12.463887
Show Author Affiliations
Jeong Weon Wu, Ewha Womans Univ. (South Korea)
Jisoo Hwang, Ewha Womans Univ. (South Korea)
N. Y. Ha, Ewha Womans Univ. (South Korea)
J. Lim, Ewha Womans Univ. (South Korea)
Byoungchoo Park, Ewha Womans Univ. (South Korea)
Chang-Jun Ahn, Chongju Univ. (South Korea)
Suk-Young Khoo, Chongju Univ. (South Korea)
Chi-Sup Jung, Chongju Univ. (South Korea)

Published in SPIE Proceedings Vol. 4655:
Photonic Bandgap Materials and Devices
Ali Adibi; Axel Scherer; Shawn-Yu Lin, Editor(s)

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