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Proceedings Paper

Monitoring of soil degradation potential in semi-arid soils using hyperspectroscopy technology
Author(s): Eyal Ben-Dor; N. Goldshalager; M. Agassi; Alexander F. H. Goetz; Ofer Braun; Bruce C. Kindel; Y. Binaymini; David Bonfil
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Paper Abstract

Based on previous studies that showed significant correlation between crusted soil and their reflectance properties, we applied a systematic study over Loess soil from Israel using Hyperspectral (or Imaging Spectroscopy) technology. A simulation for rain events under laboratory conditions, using the selected soil and varying rain energy treatments was conducted and reflectance properties of the crusted soils were measured. A spectral parameter defined as a Normalized Spectral Area (NSA) was used to assess for the crust status (based on the area under a ratio spectrum relative to a known non-crusted soils' plot). The NSA laboratory parameter was applied to the AISA data using ground controlled soil plots (crusted and non crusted). A reasonable agreement was obtained between the two data sets (laboratory and air) suggesting that infiltration rates values can be estimated remotely. It is strongly suggested that future study, will use the full optical range (VIS-NIR-SWIR-TIR) in the IS technology to map the crust status in a better precise way.

Paper Details

Date Published: 14 March 2003
PDF: 9 pages
Proc. SPIE 4886, Remote Sensing for Environmental Monitoring, GIS Applications, and Geology II, (14 March 2003); doi: 10.1117/12.462966
Show Author Affiliations
Eyal Ben-Dor, Univ. of Colorado/Boulder (United States)
N. Goldshalager, Ministry of Agriculture (United States)
M. Agassi, Ministry of Agriculture (United States)
Alexander F. H. Goetz, Univ. of Colorado/Boulder (United States)
Ofer Braun, Bar-Kal Systems Engineering, Ltd. (United States)
Bruce C. Kindel, Univ. of Colorado/Boulder (United States)
Y. Binaymini, Ministry of Agriculture (United States)
David Bonfil, Agriculture Research Organization (Israel)

Published in SPIE Proceedings Vol. 4886:
Remote Sensing for Environmental Monitoring, GIS Applications, and Geology II
Manfred Ehlers, Editor(s)

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