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Proceedings Paper

Failure mode analysis of high-power laser diodes
Author(s): Robert G. Ahrens; James J. Jaques; Niloy K. Dutta; Michael J. LuValle; Alfonso B. Piccirilli; Ron M. Camarda; Anthony B. Fields; Kenneth R. Lawrence
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Paper Abstract

In this paper, we present the results of a preliminary investigation on the reliability of high power optical diodes. Commercially available 970 nm optical diodes were subjected to various levels of stress, including: operating current, optical power and operating temperature. Optical diodes that failed during testing were subsequently analyzed using a variety of techniques, including: optical microscopy, scanning electron microscopy, eletroluminescence, and near-field profiling. It has been observed that the major cause of optical failure can be attributed to damage on the emitting facet of the optical diodes. Preliminary evidence suggests that facet damage is a result of catastrophic optical damage.

Paper Details

Date Published: 16 April 2002
PDF: 13 pages
Proc. SPIE 4648, Test and Measurement Applications of Optoelectronic Devices, (16 April 2002); doi: 10.1117/12.462657
Show Author Affiliations
Robert G. Ahrens, Lucent Technologies/Bell Labs. (United States)
James J. Jaques, Lucent Technologies/Bell Labs. (United States)
Niloy K. Dutta, Univ. of Connecticut (United States)
Michael J. LuValle, OFS Fitel (United States)
Alfonso B. Piccirilli, Lucent Technologies/Bell Labs. (United States)
Ron M. Camarda, Lucent Technologies/Bell Labs. (United States)
Anthony B. Fields, Lucent Technologies/Bell Labs. (United States)
Kenneth R. Lawrence, Lucent Technologies/Bell Labs. (United States)

Published in SPIE Proceedings Vol. 4648:
Test and Measurement Applications of Optoelectronic Devices
Niloy K. Dutta; Aland K. Chin; Robert W. Herrick; Niloy K. Dutta; Robert W. Herrick; Kurt J. Linden; Daniel J. McGraw, Editor(s)

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