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Proceedings Paper

Optical techniques for microwave monolithic circuit characterization
Author(s): Hing-Loi A. Hung; Ming-Guang Li; Chi Hsiang Lee
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Paper Abstract

Based on the electro-optic (EO) sampling approach, a technique has been developed which offers high detection sensitivity for the measurement of two-dimensional electric field distribution in a GaAs microstrip line circuit. The interference effect in the EO sampling process was also investigated using this technique. The study resulted in a better understanding of the limitations of EO sampling. It is shown that correct use of the pulse width of the laser beam with respect to GaAs substrate thickness can lead to an accurate and consistent optical characterization of monolithic microwave integrated circuits (MMICs).

Paper Details

Date Published: 1 August 1991
PDF: 6 pages
Proc. SPIE 1476, Optical Technology for Microwave Applications V, (1 August 1991); doi: 10.1117/12.46258
Show Author Affiliations
Hing-Loi A. Hung, COMSAT Labs. (United States)
Ming-Guang Li, Univ. of Maryland (United States)
Chi Hsiang Lee, Univ. of Maryland (United States)

Published in SPIE Proceedings Vol. 1476:
Optical Technology for Microwave Applications V
Shi-Kay Yao, Editor(s)

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