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Proceedings Paper

Fabrication of a thin film exponential transmission lines by superconducting materials for high-speed communication devices
Author(s): Etrur Rrustemaj; Besim Ilazi
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Paper Abstract

This paper presents both experimental investigations and modeled results on high temperature superconductive exponential microstrip lines. High-Tc ceramic (YBCO) superconducting exponential microstrip lines have been fabricated by sputtering technique, conditions and properties for preparation of exponential microstrip lines are described. The behavior of superconducting microstrip lines approaches that of normal state microstrip line as the strip and ground plane thickness and the substrate thickness become large compared to penetration depth. In order to verify the validity of the implemented macro model for the superconducting exponential microstrip line, a microstrip line structure connected to an inductor having one end grounded with an AC current source used to excite the circuit is simulated. Furthermore we have investigated how a pulse propagates on the superconducting exponential microstrip line and how the circuit parameters of transmission lines affect the propagation characteristic of the line. Simulation results show that the High-Tc exponential transmission lines are more promising for interconnections than the conventional transmission lines by virtue of their lower attenuation and less dispersion, even if dielectric loss of substrate is taken into consideration. This work forms a general basis for the investigation of the exponential microstrip line for use in high speed detection circuit.

Paper Details

Date Published: 9 April 2002
PDF: 6 pages
Proc. SPIE 4679, Laser-Induced Damage in Optical Materials: 2001, (9 April 2002); doi: 10.1117/12.461708
Show Author Affiliations
Etrur Rrustemaj, Univ. of Prishtina (Kosovo)
Besim Ilazi, Institute of Telecommunication and Information Technology (Kosovo)

Published in SPIE Proceedings Vol. 4679:
Laser-Induced Damage in Optical Materials: 2001
Gregory J. Exarhos; Arthur H. Guenther; Keith L. Lewis; M. J. Soileau; Christopher J. Stolz, Editor(s)

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