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Proceedings Paper

Origin of laser-induced internal cooling of Yb3+-doped systems
Author(s): Joaquin R. Fernandez; A. Mendioroz; Rolindes Balda; M. Voda; M. Al-Saleh; A. J. Garcia-Adeva; Jean-Luc Adam; Jacques Lucas
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Paper Abstract

Laser induced internal cooling has been investigated in a new fluorochloride glass (CNBZn) and a fluoride glass (BIG) doped with 2.1x1020 Yb3+ ions/cm3 and in a Kpb2Cl5 crystal doped with 5x1019 Yb3+ by using collinear photothermal deflection and conventional laser excitation spectroscopies under high photon irradiances. The cooling efficiency for CNBZn glass which is approximately 2% relative to the absorbed laser power at 1010 nm and 300 K falls about 20% at 77 K. The cooling efficiency for BIG glass was only approximately 6% at room temperature. For the Yb3+ doped Kpb2Cl5 crystal we have shown internal laser cooling with a cooling efficiency of about 0.2% at room temperature. This is the third ytterbium-doped crystal, after Kgd(WO4) (Ref.10) and YAG (Ref.11), in which anti-Stokes laser-induced internal cooling has been demonstrated. The observed temperature dependence of the cooling process can be explained by a simple model accounting for the photon-ion- photon interaction.

Paper Details

Date Published: 5 April 2002
PDF: 13 pages
Proc. SPIE 4645, Rare-Earth-Doped Materials and Devices VI, (5 April 2002); doi: 10.1117/12.461649
Show Author Affiliations
Joaquin R. Fernandez, Escuela Superior de Ingenieros, Univ. del Pais Vasco, and Donostia International Physics (Spain)
A. Mendioroz, Escuela Superior de Ingenieros (Spain)
Rolindes Balda, Escuela Superior de Ingenieros, Univ. del Pais Vasco, and Donostia International Physics C (Spain)
M. Voda, Donostia International Physics Ctr. (Spain)
M. Al-Saleh, Escuela Superior de Ingenieros (Spain)
A. J. Garcia-Adeva, Los Alamos National Lab. (United States)
Jean-Luc Adam, Univ. de Rennes I (France)
Jacques Lucas, Univ. de Rennes I (France)

Published in SPIE Proceedings Vol. 4645:
Rare-Earth-Doped Materials and Devices VI
Shibin Jiang; Robert W. Keys, Editor(s)

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