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Proceedings Paper

Micromachining and material change characterization using femtosecond laser oscillators
Author(s): Christopher B. Schaffer; Juerg Aus der Au; Eric Mazur; Jeffrey A. Squier
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Paper Abstract

We use third harmonic generation (THG) microscopy to image waveguides and single-shot structural modifications produced in bulk glass using femtosecond laser pulses. THG microscopy reveals the internal structure of waveguides written with a femtosecond laser oscillator, and gives a three-dimensional view of the complicated morphology of the structural changes produced with single, above-threshold femtosecond pulses. We find that THG microscopy is as sensitive to refractive index change as differential interference contrast microscopy, while also offering the three-dimensional sectioning capabilities of a nonlinear microscopy technique. It is now possible to micromachine three-dimensional optical devices and to image these structures in three dimensions, all with a single femtosecond laser oscillator.

Paper Details

Date Published: 1 April 2002
PDF: 7 pages
Proc. SPIE 4633, Commercial and Biomedical Applications of Ultrafast and Free-Electron Lasers, (1 April 2002); doi: 10.1117/12.461370
Show Author Affiliations
Christopher B. Schaffer, Univ. of California/San Diego (United States)
Juerg Aus der Au, Univ. of California/San Diego (United States)
Eric Mazur, Harvard Univ. (United States)
Jeffrey A. Squier, Univ. of California/San Diego (United States)

Published in SPIE Proceedings Vol. 4633:
Commercial and Biomedical Applications of Ultrafast and Free-Electron Lasers
Joseph Neev; Glenn S. Edwards; Joseph Neev; Andreas Ostendorf; Andreas Ostendorf; John Clark Sutherland, Editor(s)

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