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Proceedings Paper

Sensitivity of optical metrology calibration to measured corner cube retroreflector parameters for the Space Interferometry Mission
Author(s): Gary M. Kuan; Steven J. Moser
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Paper Abstract

Picometer scale optical metrology specifications for the Space Interferometry Mission require precision calibration functions involving the optical and orientation characteristics of corner cube retroreflectors. Accurate knowledge of such parameters as the index of refraction of the reflective coating, dihedral between facets, and the orientation of the retroreflector with respect to the interrogating metrology beam and its polarization state is critical. Knowledge errors result in optical path differences that are shown to be on the order of nanometers. These sensitivities are determined from Zemax-generated models and measured parameters. Due to the stringent requirements of SIM, accurate and consistent experimental measurements of corner cube characteristics are required for improved calibration of mission metrology systems. Initial dihedral measurements to within 0.05 arcsecond and refractive indices to within 1% are obtained and integrated into the models.

Paper Details

Date Published: 26 February 2003
PDF: 8 pages
Proc. SPIE 4852, Interferometry in Space, (26 February 2003); doi: 10.1117/12.460544
Show Author Affiliations
Gary M. Kuan, Jet Propulsion Lab. (United States)
Steven J. Moser, Jet Propulsion Lab. (United States)

Published in SPIE Proceedings Vol. 4852:
Interferometry in Space
Michael Shao, Editor(s)

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