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Proceedings Paper

High-speed H-alpha camera and a real-time image processing system for solar observations
Author(s): Yoichiro Hanaoka; Motokazu Noguchi; Takashi Sakurai; Kiyoshi Ichimoto
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Paper Abstract

We have developed a new digital imaging system for the Hα imager of the Solar Flare Telescope at Mitaka, NAOJ, for high-cadence observations of solar flares. To resolve individual spikes elementary bursts) of impulsive solar flares requires a time resolution within 1 s and a spatial resolution of about 1", and the high-speed Hα camera realized them. Such high-resolution observations produce huge amount of data, and it has been the major difficulty to construct a high-cadence system. Generally the amount of data from solar optical observations is huge, because they are multi-dimensional (in space/time/wavelength/polarization status). Efficient real-time processing of observational data is essentially important to extract meaningful information from the raw data. Recent advances in computer technology have made possible to handle vast data with a small computer. Therefore, firstly we have developed a PC-based flexible real-time image processing system, which is applicable to various real-time data processings required for solar optical observations. The high-speed Hα camera is developed based on this system. In this paper, the real-time image processing system and the high-speed Hα camera system are described as well as the actual operation of the Hα camera.

Paper Details

Date Published: 11 February 2003
PDF: 8 pages
Proc. SPIE 4853, Innovative Telescopes and Instrumentation for Solar Astrophysics, (11 February 2003); doi: 10.1117/12.460279
Show Author Affiliations
Yoichiro Hanaoka, National Astronomical Observatory (Japan)
Motokazu Noguchi, National Astronomical Observatory (Japan)
Takashi Sakurai, National Astronomical Observatory (Japan)
Kiyoshi Ichimoto, National Astronomical Observatory (Japan)

Published in SPIE Proceedings Vol. 4853:
Innovative Telescopes and Instrumentation for Solar Astrophysics
Stephen L. Keil; Sergey V. Avakyan, Editor(s)

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