
Proceedings Paper
Compatability test for phase-change erasable and WORM media in a multifunction driveFormat | Member Price | Non-Member Price |
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Paper Abstract
We have presented configuration of the multifunction drive, interchangeability test, and reliability test consisting of temperature test and reading many cycles test. The multifunction drive could be realized by adding laser power control block and the polarity switch of reading amplifier without changing the WORM's head on a current WORM drive. Interchangeability test results showed having good interchangeability among multifunction drives or among WORM drives, and also the multifunction drive had full compatibility with current WORM drive on the current WORM disk. Reliability test results for the multifunction drive using a PCE disk and a WORM disk showed that writing sensitivities of both disks were much less dependent ont he temperature and the drive had stable writing characteristics in environments from 5 degree(s)C to 50 degree(s)C, and furthermore no error bit was observed while reading the most inner track of each disk 10 million cycles with the read power of 1.8 mW being 20% up to normal one at 6.1 m/s of disk velocity.
Paper Details
Date Published: 1 July 1991
PDF: 8 pages
Proc. SPIE 1499, Optical Data Storage '91, (1 July 1991); doi: 10.1117/12.45923
Published in SPIE Proceedings Vol. 1499:
Optical Data Storage '91
James J. Burke; Thomas A. Shull; Nobutake Imamura, Editor(s)
PDF: 8 pages
Proc. SPIE 1499, Optical Data Storage '91, (1 July 1991); doi: 10.1117/12.45923
Show Author Affiliations
Shunji Ohara, Matsushita Electric Industrial Co., Ltd. (Japan)
Takashi Ishida, Matsushita Electric Industrial Co., Ltd. (Japan)
Chikashi Inokuchi, Matsushita Electric Industrial Co., Ltd. (Japan)
Tadashige Furutani, Matsushita Electric Industrial Co., Ltd. (Japan)
Takashi Ishida, Matsushita Electric Industrial Co., Ltd. (Japan)
Chikashi Inokuchi, Matsushita Electric Industrial Co., Ltd. (Japan)
Tadashige Furutani, Matsushita Electric Industrial Co., Ltd. (Japan)
Kenzo Ishibashi, Matsushita Electric Industrial Co., Ltd. (Japan)
Akira Kurahashi, Matsushita Electric Industrial Co., Ltd. (Japan)
Tomio Yoshida, Matsushita Electric Industrial Co., Ltd. (Japan)
Akira Kurahashi, Matsushita Electric Industrial Co., Ltd. (Japan)
Tomio Yoshida, Matsushita Electric Industrial Co., Ltd. (Japan)
Published in SPIE Proceedings Vol. 1499:
Optical Data Storage '91
James J. Burke; Thomas A. Shull; Nobutake Imamura, Editor(s)
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