Recent studies have shown that pixelated HgI₂ detectors with a thickness of 1 cm can yield energy resolutions of 1.4 - 2% FWHM at 662 keV γ-ray energy, which are similar to that obtained on 3-dimensional position sensitive CdZnTe detectors of the same thickness. However, there is a need to better understand the electron transportation and induced charge from the drift of charges within the detector in order to better understand the spectra obtained from HgI₂ detectors. The results of a simple simulation model accounting for electron trapping and various weighting potentials is compared with recent physical spectra obtained from pixelated HgI₂ detectors of 5 mm and 10 mm thickness.

Date Published: 10 January 2003
PDF: 9 pages
Proc. SPIE 4784, X-Ray and Gamma-Ray Detectors and Applications IV, (10 January 2003); doi: 10.1117/12.455979

Published in SPIE Proceedings Vol. 4784:
X-Ray and Gamma-Ray Detectors and Applications IV
Ralph B. James; Edwin M. Westbrook; Roger D. Durst; Larry A. Franks; Arnold Burger; Edwin M. Westbrook; Roger D. Durst, Editor(s)