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Proceedings Paper

Recent results from thin-film-coated semiconductor neutron detectors
Author(s): Douglas S. McGregor; Raymond T. Klann; Jeffrey D. Sanders; John T. Lindsay; Kurt J. Linden; Holly K. Gersch; P. M. De Lurgio; Charles L. Fink; Elsa Ariesanti
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Paper Abstract

Semiconductor based thermal neutron detectors provide a compact technology for neutron detection and imaging. Such devices can be produced by externally coating semiconductor charged particle detectors with neutron reactive films that convert free neutrons into charged-particle reaction products. Commonly used films for such devices utilize the 10B(n,a)7Li reaction or the 6Li(n,a)3H reaction, which are attractive due to the relatively high energies imparted to the reaction products. Unfortunately, thin film or "foil" type thermal neutron detectors suffer from self-absorption effects that ultimately limit neutron detection efficiency. Design considerations that maximize the efficiency and performance of such devices are discussed. Linear arrays fabricated from thin-film-coated pixel detectors are presented with results.

Paper Details

Date Published: 10 January 2003
PDF: 19 pages
Proc. SPIE 4784, X-Ray and Gamma-Ray Detectors and Applications IV, (10 January 2003); doi: 10.1117/12.455697
Show Author Affiliations
Douglas S. McGregor, Kansas State Univ. (United States)
Raymond T. Klann, Argonne National Lab. (United States)
Jeffrey D. Sanders, Argonne National Lab. (United States)
John T. Lindsay, Inner Vision (United States)
Kurt J. Linden, Spire Corp. (United States)
Holly K. Gersch, Univ. of Michigan (United States)
P. M. De Lurgio, Argonne National Lab. (United States)
Charles L. Fink, Argonne National Lab. (United States)
Elsa Ariesanti, Kansas State Univ. (United States)

Published in SPIE Proceedings Vol. 4784:
X-Ray and Gamma-Ray Detectors and Applications IV
Ralph B. James; Edwin M. Westbrook; Roger D. Durst; Larry A. Franks; Arnold Burger; Edwin M. Westbrook; Roger D. Durst, Editor(s)

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