Share Email Print

Proceedings Paper

Relevant modeling and comparison of geometric distortions in watermarking systems
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

A challenging aspect in the development of robust watermarking algorithms is the ability to withstand complex geometric distortion of the media. A few existing techniques are known to deal with such transformations up to a certain level. Traditionally, the measure of the degradation caused by an attack on an image only addressed the pixel value modification. However, a degradation consequent to the geometric distortion of an image cannot be measured with traditional criteria. Therefore the evaluation and comparison of the robustness to desynchronization of different watermarking schemes was not possible. In this paper, we present an innovative method to measure the distortion introduced by complex geometric deformations of an image. The distortion measure is expressed in term of how closely the applied transform can be approximated by a simpler transform model (e.g. RST transform, affine transform). The scheme relies on the local least square estimation of the parameters of the reference transform model. Eventually, we illustrate the proposed measure by presenting some results for different complex image distortions.

Paper Details

Date Published: 21 November 2002
PDF: 11 pages
Proc. SPIE 4790, Applications of Digital Image Processing XXV, (21 November 2002); doi: 10.1117/12.455357
Show Author Affiliations
Damien Delannay, Univ. catholique de Louvain (Belgium)
Iwan Setyawan, Technische Univ. Delft (Netherlands)
Reginald L. Lagendijk, Technische Univ. Delft (Netherlands)
Benoît M. M. Macq, Univ. catholique de Louvain (Belgium)

Published in SPIE Proceedings Vol. 4790:
Applications of Digital Image Processing XXV
Andrew G. Tescher, Editor(s)

© SPIE. Terms of Use
Back to Top