Share Email Print

Proceedings Paper

Knowledge-based approach to fault diagnosis and control in distributed process environments
Author(s): Kwangsue Chung; Julius T. Tou
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

This paper presents a new design approach to knowledge-based decision support systems for fault diagnosis and control for quality assurance and productivity improvement in automated manufacturing environments. Based on the observed manifestations, the knowledge-based diagnostic system hypothesizes a set of the most plausible disorders by mimicking the reasoning process of a human diagnostician. The data integration technique is designed to generate error-free hierarchical category files. A novel approach to diagnostic problem solving has been proposed by integrating the PADIKS (Pattern-Directed Knowledge-Based System) concept and the symbolic model of diagnostic reasoning based on the categorical causal model. The combination of symbolic causal reasoning and pattern-directed reasoning produces a highly efficient diagnostic procedure and generates a more realistic expert behavior. In addition, three distinctive constraints are designed to further reduce the computational complexity and to eliminate non-plausible hypotheses involved in the multiple disorders problem. The proposed diagnostic mechanism, which consists of three different levels of reasoning operations, significantly reduces the computational complexity in the diagnostic problem with uncertainty by systematically shrinking the hypotheses space. This approach is applied to the test and inspection data collected from a PCB manufacturing operation.

Paper Details

Date Published: 1 March 1991
PDF: 10 pages
Proc. SPIE 1468, Applications of Artificial Intelligence IX, (1 March 1991); doi: 10.1117/12.45476
Show Author Affiliations
Kwangsue Chung, Univ. of Florida (South Korea)
Julius T. Tou, Univ. of Florida (United States)

Published in SPIE Proceedings Vol. 1468:
Applications of Artificial Intelligence IX
Mohan M. Trivedi, Editor(s)

© SPIE. Terms of Use
Back to Top
Sign in to read the full article
Create a free SPIE account to get access to
premium articles and original research
Forgot your username?