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Proceedings Paper

High-energy characterization of multilayers for hard x-ray astronomy
Author(s): Adrian Ivan; Ricardo J. Bruni; Stephen B. Cenko; Paul Gorenstein; Suzanne E. Romaine
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Paper Abstract

We report the results obtained during the second phase of a program which consists of comparing the performance of different multilayer material combinations. These coatings will be used to extend the bandpass of current hard X-ray optics toward 100 keV, an order of magnitude higher than present technology. The materials studied here are W/Si, Pt/C, and W/C. A comparison of the performance of depth graded multilayers of these different materials at energies 30-80 keV was undertaken. Specular reflectivity data were acquired at 30-80 keV using the X17B1 beamline of the National Synchrotron Light Source. Reflectivity versus energy plots showed a high enough reflectivity for the bandpass of interest at grazing angles typical for hard x-ray telescope mirror shells. The next phase of our program will continue with similar high-energy pencil beam measurements on multilayer coated telescope prototype shells.

Paper Details

Date Published: 30 January 2002
PDF: 6 pages
Proc. SPIE 4496, X-Ray Optics for Astronomy: Telescopes, Multilayers, Spectrometers, and Missions, (30 January 2002); doi: 10.1117/12.454366
Show Author Affiliations
Adrian Ivan, Massachussetts Institute of Technology and Smithsonian Astrophysical Observatory (United States)
Ricardo J. Bruni, Smithsonian Astrophysical Observatory (United States)
Stephen B. Cenko, Smithsonian Astrophysical Observatory and Harvard Univ. (United States)
Paul Gorenstein, Smithsonian Astrophysical Observatory (United States)
Suzanne E. Romaine, Smithsonian Astrophysical Observatory (United States)

Published in SPIE Proceedings Vol. 4496:
X-Ray Optics for Astronomy: Telescopes, Multilayers, Spectrometers, and Missions
Paul Gorenstein; Richard B. Hoover, Editor(s)

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