Proceedings Paper
Derivation and measurement of the M/# in spectral hole burning media| Format | Member Price | Non-Member Price |
|---|---|---|
| $17.00 | $21.00 |
Paper Abstract
We demonstrate 10 plane wave holograms angularly multiplexed at one frequency channel in spectral hole burning medium. We show that the M/# is still a valid system metric and the measured M/# in one frequency channel is about 0.01.
Paper Details
Date Published: 23 January 2002
PDF: 6 pages
Proc. SPIE 4459, Photorefractive Fiber and Crystal Devices: Materials, Optical Properties, and Applications VII, and Optical Data Storage, (23 January 2002); doi: 10.1117/12.454034
Published in SPIE Proceedings Vol. 4459:
Photorefractive Fiber and Crystal Devices: Materials, Optical Properties, and Applications VII, and Optical Data Storage
Shizhuo Yin; Hans J. Coufal; Francis T. S. Yu; Hans J. Coufal, Editor(s)
PDF: 6 pages
Proc. SPIE 4459, Photorefractive Fiber and Crystal Devices: Materials, Optical Properties, and Applications VII, and Optical Data Storage, (23 January 2002); doi: 10.1117/12.454034
Show Author Affiliations
Zhiwen Liu, California Institute of Technology (United States)
Wenhai Liu, California Institute of Technology (United States)
Christophe Moser, California Institute of Technology (United States)
David Zhang, California Institute of Technology (United States)
Wenhai Liu, California Institute of Technology (United States)
Christophe Moser, California Institute of Technology (United States)
David Zhang, California Institute of Technology (United States)
Iouri V. Solomatine, California Institute of Technology (United States)
Demetri Psaltis, California Institute of Technology (United States)
Anshel A. Gorokhovsky, CUNY/College of Staten Island (United States)
Demetri Psaltis, California Institute of Technology (United States)
Anshel A. Gorokhovsky, CUNY/College of Staten Island (United States)
Published in SPIE Proceedings Vol. 4459:
Photorefractive Fiber and Crystal Devices: Materials, Optical Properties, and Applications VII, and Optical Data Storage
Shizhuo Yin; Hans J. Coufal; Francis T. S. Yu; Hans J. Coufal, Editor(s)
© SPIE. Terms of Use
