Proceedings Paper
Optical characterization of multilayer stacks for phase-change media| Format | Member Price | Non-Member Price |
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Paper Abstract
We report results of measurements of the optical constants of the dielectric layer, reflecting layer, and phase-change layer used as the media of phase-change optical recording. The refractive index and the absorption coefficient k of these materials vary to some extent with the film thickness and with the film deposition environment. We report the observed variations of optical constants among samples of differing structure and among samples fabricated in different laboratories.
Paper Details
Date Published: 10 January 2002
PDF: 12 pages
Proc. SPIE 4342, Optical Data Storage 2001, (10 January 2002); doi: 10.1117/12.453427
Published in SPIE Proceedings Vol. 4342:
Optical Data Storage 2001
Terril Hurst; Seiji Kobayashi, Editor(s)
PDF: 12 pages
Proc. SPIE 4342, Optical Data Storage 2001, (10 January 2002); doi: 10.1117/12.453427
Show Author Affiliations
Rongguang Liang, Optical Sciences Ctr./Univ. of Arizona (United States)
Chubing Peng, Optical Sciences Ctr./Univ. of Arizona (United States)
Kenichi Nagata, Matsushita Electric Industrial Co., Ltd. (Japan)
Chubing Peng, Optical Sciences Ctr./Univ. of Arizona (United States)
Kenichi Nagata, Matsushita Electric Industrial Co., Ltd. (Japan)
Kelly Daly Flynn, Energy Conversion Devices, Inc. (United States)
Masud Mansuripur, Optical Sciences Ctr./Univ. of Arizona (United States)
Masud Mansuripur, Optical Sciences Ctr./Univ. of Arizona (United States)
Published in SPIE Proceedings Vol. 4342:
Optical Data Storage 2001
Terril Hurst; Seiji Kobayashi, Editor(s)
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